Conductive-probe measurements with nanodots of free-base and metallated porphyrins.
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DOI: 10.1016/j.jcis.2016.09.039
Abstract: The conductive properties of nanodots of model porphyrins were investigated using conductive-probe atomic force microscopy (CP-AFM). Porphyrins provide excellent models for preparing surface structures that can potentially be used as building blocks for devices. The… read more here.
Keywords: probe measurements; probe; conductive properties; nanodots free ... See more keywords