Characterization of Structural and Configurational Properties of DNA by Atomic Force Microscopy.
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DOI: 10.1007/978-1-4939-7306-4_37
Abstract: We describe a method to extract quantitative information on DNA structural and configurational properties from high-resolution topographic maps recorded by atomic force microscopy (AFM). DNA molecules are deposited on mica surfaces from an aqueous solution,… read more here.
Keywords: microscopy; force microscopy; configurational properties; atomic force ... See more keywords