Optical constants modelling in silicon nitride membrane transiently excited by EUV radiation.
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DOI: 10.1364/oe.26.011877
Abstract: We hereby report on a set of transient optical reflectivity and transmissivity measurements performed on silicon nitride thin membranes excited by extreme ultraviolet (EUV) radiation from a free electron laser (FEL). Experimental data were acquired… read more here.
Keywords: euv radiation; silicon nitride; optical constants; constants modelling ... See more keywords