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   Articles with "contact performance" as a keyword



Study on contact performance of ultrasonic‐assisted grinding surface

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recommendations! Published in 2019 at "Ultrasonics"

DOI: 10.1016/j.ultras.2018.08.009

Abstract: HighlightsA rough surface contact model which is suitable for ultrasonic‐assisted surfaces is proposed.The correlation between the parameters of grinding and the contact performance is obtained.The interference motion of abrasive particles is good for contact performance… read more here.

Keywords: surface; ultrasonic assisted; contact performance; contact ... See more keywords

The Effect of Corrosion on the Electrical Contact Performance of Aviation Connectors Revealed by In Situ Impedance Measurements

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recommendations! Published in 2025 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"

DOI: 10.1109/tcpmt.2024.3448431

Abstract: This work proposes a new method to evaluate the electrical contact performance of aviation connectors by in situ measurement of broadband impedance. The broadband impedance of the wire connector under corrosive environments is measured using… read more here.

Keywords: contact performance; impedance; aviation connectors; electrical contact ... See more keywords

Study on the Lumped Evaluation Model of Sliding Electrical Contact Performance of Railgun

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recommendations! Published in 2019 at "IEEE Transactions on Plasma Science"

DOI: 10.1109/tps.2019.2893325

Abstract: The sliding electrical contact performance of electromagnetic railgun is the main factor affecting the launch accuracy, launch efficiency, and working life of electromagnetic railguns. The research on the evaluation of sliding electrical contact performance of… read more here.

Keywords: contact performance; evaluation; sliding electrical; railgun ... See more keywords

Significant improvement of n-contact performance and wall plug efficiency of AlGaN-based deep ultraviolet light-emitting diodes by atomic layer etching.

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recommendations! Published in 2024 at "Optics letters"

DOI: 10.1364/ol.530719

Abstract: The reactive ion etching (RIE) process is needed to fabricate deep ultraviolet (DUV) light-emitting diodes (LEDs). However, the n-contact performance deteriorates when the high-Al n-AlGaN surface undergoes RIE, leading to decreased LED performance. In this… read more here.

Keywords: layer; deep ultraviolet; contact performance; surface ... See more keywords