Linearizing the frequency‐stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterization
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DOI: 10.1002/jemt.24070
Abstract: To facilitate mechanical characterization by contact resonance atomic force microscopy (CR‐AFM), a cantilever that could enable a near linear relation between CR‐frequency and contact stiffness is designed. The optimized structure is fabricated through removing a… read more here.
Keywords: contact; microscopy; mechanical characterization; contact resonance ... See more keywords
Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy
Sign Up to like & getrecommendations! Published in 2021 at "Nanotechnology"
DOI: 10.1088/1361-6528/abf37a
Abstract: To enhance contact resonance atomic force microscopy (CR-AFM) and harmonic AFM imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the cantilever’s dynamic properties is realized by either mass-removing or mass-adding. As prototypes, focused… read more here.
Keywords: microscopy; force microscopy; atomic force; contact resonance ... See more keywords
Experimental validation of contact resonance AFM using long massive tips.
Sign Up to like & getrecommendations! Published in 2023 at "Nanotechnology"
DOI: 10.1088/1361-6528/acda37
Abstract: In this work, we present an experimental validation of a new contact resonance atomic force microscopy model developed for sensors with long, massive tips. A derivation of a new technique and graphical method for the… read more here.
Keywords: long massive; experimental validation; contact; massive tips ... See more keywords