Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy
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DOI: 10.1017/s1431927617004810
Abstract: Contamination and charging of the specimen is a common issue in electron microscopy and can lead to disturbing artifacts in transmission electron microscopy (TEM) and especially in scanning (S)TEM, where a focused electron beam is… read more here.
Keywords: contamination charging; amorphous thin; microscopy; contamination ... See more keywords