Enhancing the defect contrast in ECCI through angular filtering of BSEs.
Sign Up to like & getrecommendations! Published in 2019 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2019.112922
Abstract: In this study, an annular multi-segment backscattered electron (BSE) detector is used in back scatter geometry to investigate the influence of the angular distribution of BSE on the crystalline defect contrast in electron channeling contrast… read more here.
Keywords: detection; contrast; defect contrast; contrast ecci ... See more keywords
Two beam toy model for dislocation contrast in ECCI
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619010572
Abstract: Dislocation contrast in the SEM, as observed though electron channelling contrast imaging (ECCI), is commonly treated analogously to the contrast in the TEM. This perception is based on early studies done for dislocations parallel with… read more here.
Keywords: dislocation; two beam; dislocation contrast; contrast ... See more keywords