Charge Trapping Control in MOS Capacitors
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DOI: 10.1109/tie.2016.2645159
Abstract: This paper presents an active control of capacitance–voltage (C–V) characteristic for MOS capacitors based on sliding-mode control and sigma–delta modulation. The capacitance of the device at a certain voltage is measured periodically and adequate voltage… read more here.
Keywords: mos capacitors; trapping control; control; control mos ... See more keywords