Controlled Dislocations Injection in N/P Hg1−xCdxTe Photodiodes by Indentations
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DOI: 10.1007/s11664-019-07139-0
Abstract: HgCdTe (MCT) is a widely used semiconductor material used for manufacturing high-quality infrared detectors. At Sofradir, HgCdTe is grown by liquid phase epitaxy on lattice-matched CdZnTe substrates. Low threading dislocation densities (TDD) in the low… read more here.
Keywords: controlled dislocations; dislocations injection; xcdxte photodiodes; injection hg1 ... See more keywords