On the Experimental Verification of Electrothermal Modeling of GaN-HEMT-Based DC–DC Converters
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DOI: 10.1109/tpel.2024.3514492
Abstract: The reliability of power converters is intricately tied to the variations in the junction temperature of semiconductor devices. Therefore, possessing accurate models of these components is of paramount importance. This research introduces an electrothermal model… read more here.
Keywords: verification electrothermal; converters experimental; electrothermal modeling; based converters ... See more keywords