Impact of open-core threading dislocations on the performance of AlGaN metal-semiconductor-metal photodetectors
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DOI: 10.1063/1.5010859
Abstract: The influence of open-core threading dislocations on the bias-dependent external quantum efficiency (EQE) of bottom-illuminated Al0.5Ga0.5N/AlN metal-semiconductor-metal (MSM) photodetectors (PDs) is presented. These defects originate at the Al0.5Ga0.5N/AlN interface and terminate on the Al0.5Ga0.5N surface… read more here.
Keywords: al0 5ga0; open core; metal; core threading ... See more keywords