Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire.
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DOI: 10.1039/c9nr09024j
Abstract: A detailed structural investigation of the semiconductor-to-metal transition (SMT) in vanadium dioxide thin films deposited on sapphire substrates by pulsed laser deposition was performed by in situ temperature-dependent X-ray diffraction (XRD) measurements. The structural results… read more here.
Keywords: semiconductor metal; thin films; correlation situ; transition ... See more keywords