Articles with "cost reliability" as a keyword



Automated Bitstream-Level Cost-Reliability Design-Space Exploration for SRAM-Based FPGAs

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Published in 2025 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2025.3573225

Abstract: Triple modular redundancy (TMR) is a common approach to mitigate the effects of Single-Event Upsets (SEUs) in Single-Event Upset (SRAM)-based field-programmable gate arrays (FPGAs), where these faults may cause changes in the configuration of logic… read more here.

Keywords: cost reliability; sram based; cost; approach ... See more keywords