A saboteur and mutant based built-in self-test and counting threshold-based built-in self repairing mechanism for memories
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DOI: 10.1007/s12652-020-02284-5
Abstract: In system on chip (SOC) design, memory occupies a large area, if any defects in the memory that will affect the SOC’s total yield. To avoid this, spare rows and columns are added to the… read more here.
Keywords: built self; based built; counting threshold; self test ... See more keywords