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Published in 2020 at "Journal of Analytical Atomic Spectrometry"
DOI: 10.1039/d0ja00055h
Abstract: Depth profiling is an attractive approach for analysis of non-homogeneous samples and layered materials. This application requires an optimum sputtered crater profile, which means a flat crater bottom with steep walls and a low roughness.…
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Keywords:
crater;
crater shape;
discharge;
roughness ... See more keywords