Critical bending radius of thin single-crystalline silicon with dome and pyramid surface texturing
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DOI: 10.1016/j.scriptamat.2017.06.047
Abstract: Abstract Four-point bending tests are performed on 50-μm-thick single-crystalline silicon (Si) wafers with dome- and pyramid-shaped surface patterns, which are used as flexible Si solar cells. Surface patterns, which act as stress concentrators, reduce the… read more here.
Keywords: bending; critical bending; crystalline silicon; surface ... See more keywords