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Published in 2020 at "Radiation Effects and Defects in Solids"
DOI: 10.1080/10420150.2020.1806838
Abstract: Single Event Upset (SEU) critical charge and sensitive volume depth of 65-nm CMOS bulk SRAM are predicted through energy deposition analysis of low energy protons. The deposited energy distributions of protons calculated by GEANT4 are…
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Keywords:
sensitive volume;
critical charge;
energy;
volume depth ... See more keywords
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Published in 2022 at "Science"
DOI: 10.1126/science.abc4787
Abstract: Understanding the strange metallic behavior that develops at the brink of localization in quantum materials requires probing the underlying electronic charge dynamics. Using synchrotron radiation–based Mössbauer spectroscopy, we studied the charge fluctuations of the strange…
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Keywords:
spectroscopy;
strange metal;
charge;
critical charge ... See more keywords