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Published in 2023 at "IEEE Transactions on Automation Science and Engineering"
DOI: 10.1109/tase.2021.3125065
Abstract: In recent years, memristive crossbar-based neuromorphic computing systems (NCS) have provided a promising solution to the acceleration of neural networks. However, stuck-at faults (SAFs) in the memristor devices significantly degrade the computing accuracy of NCS.…
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Keywords:
reliability driven;
reliability;
memristive crossbar;
design ... See more keywords
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1
Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"
DOI: 10.1109/tcsi.2021.3074699
Abstract: Conventional hardened cells are not robust enough to single event upset (SEU) in 28nm technology due to the scaling of the transistors. High soft error rate is caused by particle striking at cells and logic…
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Keywords:
12t sram;
radiation hardened;
crossbar based;
based peripheral ... See more keywords
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1
Published in 2022 at "IEEE Transactions on Circuits and Systems I: Regular Papers"
DOI: 10.1109/tcsi.2022.3159153
Abstract: As the limits of transistor technology are approached, feature size in integrated circuit transistors has been reduced very near to the minimum physically-realizable channel length, and it has become increasingly difficult to meet expectations outlined…
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Keywords:
research progress;
crossbar based;
memristor;
computing systems ... See more keywords
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Published in 2017 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2017.2691713
Abstract: The use of memristors and resistive random access memory (ReRAM) technology to perform logic computations, has drawn considerable attention from researchers in recent years. However, the topological aspects of the underlying ReRAM architecture and its…
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Keywords:
logic memory;
cross point;
crossbar based;
geometry ... See more keywords