Probing Crystalline Defects Using an EBSD-Based Virtual Dark-Field Method
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619010699
Abstract: Crystalline defects such as dislocations and grain boundaries are key features of interest when characterizing the mechanisms of plasticity in metals. To visualize these defects, Transmission Electron Microscopy (TEM) based techniques, with labor-intensive sample preparation… read more here.
Keywords: field; microscopy; crystalline defects; dark field ... See more keywords
Analysis of Crystalline Defects Caused by Growth on Partially Planarized Spalled (100) GaAs Substrates
Sign Up to like & getrecommendations! Published in 2023 at "Crystals"
DOI: 10.3390/cryst13040681
Abstract: We analyze the effect of growth on non-(100) surfaces resulting from incomplete planarization of spalled GaAs wafers on the defect structure of GaAs solar cell layers grown by hydride vapor phase epitaxy (HVPE). Controlled spalling… read more here.
Keywords: growth; gaas substrates; crystalline defects; faceted surfaces ... See more keywords