Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films
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DOI: 10.1063/5.0136229
Abstract: In this work, we have made experimental measurements of multiple-hump total electron emission yield (TEEY) curves on SiO2 thin films. A Monte-Carlo electron transport model, published in Gibaru et al., J. Electron Spectrosc. Relat. Phenom.… read more here.
Keywords: hump; emission yield; curves sio2; electron ... See more keywords