Customized MFM probes based on magnetic nanorods.
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DOI: 10.1039/d0nr00322k
Abstract: Focused Electron Beam Induced Deposition (FEBID) for magnetic tip fabrication is presented in this work as an alternative to conventional sputtering-based Magnetic Force Microscopy (MFM) tips. FEBID enables the growth of a high-aspect-ratio magnetic nanorod… read more here.
Keywords: probes based; based magnetic; customized mfm; mfm probes ... See more keywords