Combined Electrochemical Impedance Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy study of the distinct behavior of L-cysteine-thiolate formed at p- and n-GaAs(100) electrodes in Sodium Dodecyl Sulfate solution
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DOI: 10.1016/j.electacta.2016.12.156
Abstract: Abstract Electrochemical impedance spectroscopy (EIS), X-ray spectroscopy (XPS), and atomic force microscopy (AFM) have been used to investigate the effects of the sodium dodecyl sulfate (SDS) interaction with the L-cysteine-thiolate covered p- and n-GaAs(100) electrodes… read more here.
Keywords: cysteine thiolate; gaas 100; spectroscopy; microscopy ... See more keywords