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Published in 2018 at "Particuology"
DOI: 10.1016/j.partic.2017.10.013
Abstract: Abstract In nanoparticle sizing using the ultrafast image-based dynamic light scattering (UIDLS) method, larger impurities and dark noise from the complementary metal-oxide-semiconductor (CMOS) detector affect measurement accuracy. To solve this problem, a two-dimensional self-adapting fast…
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Keywords:
dark noise;
fast fourier;
self adapting;
fourier transform ... See more keywords