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Published in 2017 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2016.2618859
Abstract: A defect diagnosis procedure is an important part of the yield improvement process. As defects become more complex, the output responses they produce differ to larger extents from the output responses of modeled faults, and…
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Keywords:
identifying biases;
defect diagnosis;
biases defect;
diagnosis ... See more keywords
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Published in 2022 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2022.3160543
Abstract: Convolutional neural networks (CNNs) have promoted the development of insulation defect diagnosis for gas-insulated switchgear (GIS) because of their excellent feature extraction and classification capabilities. However, CNN ignores the correlation between the local areas of…
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Keywords:
network;
insulation defect;
graph;
insulation ... See more keywords
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Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2018.2849972
Abstract: A simulation-based design verification process creates a large pool of functional test sequences. Such sequences have several advantages when they are used as manufacturing tests and for defect diagnosis. This brief considers the problem of…
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Keywords:
defect diagnosis;
functional test;
diagnosis;
selecting functional ... See more keywords