Bug Localization for Version Issues With Defect Patterns
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Access"
DOI: 10.1109/access.2019.2894976
Abstract: Version issues are becoming more and more prominent with the continuous development of software. Bug localization for version issues is time-consuming and labor-intensive. Although some bug localization techniques, such as those based on information retrieval… read more here.
Keywords: version; defect patterns; version related; bug localization ... See more keywords
Deep-Structured Machine Learning Model for the Recognition of Mixed-Defect Patterns in Semiconductor Fabrication Processes
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Transactions on Semiconductor Manufacturing"
DOI: 10.1109/tsm.2018.2825482
Abstract: Semiconductor manufacturers aim to fabricate defect-free wafers in order to improve product quality, increase yields, and reduce costs. Typically, wafer defects form spatial patterns that provide useful information, helping to identify problems and faults during… read more here.
Keywords: machine learning; mixed defect; model; defect ... See more keywords
A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Semiconductor Manufacturing"
DOI: 10.1109/tsm.2019.2904306
Abstract: A wafer map contains a graphical representation of the locations about defect pattern on the semiconductor wafer, which can provide useful information for quality engineers. Various defect patterns occur due to increasing wafer sizes and… read more here.
Keywords: semiconductor; wafer; wafer map; voting ensemble ... See more keywords
Macular ganglion cell-inner plexiform layer defect patterns in multiple sclerosis patients without optic neuritis: A Spectral-Domain-Optical Coherence Tomography Cross-Sectional, Case-Control, Pilot Study
Sign Up to like & getrecommendations! Published in 2022 at "European Journal of Ophthalmology"
DOI: 10.1177/11206721221112803
Abstract: Purpose Spectral-domain optical coherence tomography (SD-OCT) was used to evaluate, in patients with multiple sclerosis without a history of optic neuritis (MSNON), the proportion of the different macular ganglion cell-inner plexiform layer complex (mGCIP) defect… read more here.
Keywords: defect; domain optical; coherence tomography; spectral domain ... See more keywords