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   Articles with "defect recognition" as a keyword



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Dimension Reduction and Defect Recognition of Strip Surface Defects Based on Intelligent Information Processing

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recommendations! Published in 2018 at "Arabian Journal for Science and Engineering"

DOI: 10.1007/s13369-017-2825-3

Abstract: Feature extraction and classification recognition are very important for surface defect recognition of strip steel. Traditional methods of feature extraction and defect recognition cannot take into account both the recognition accuracy and the running time.… read more here.

Keywords: recognition strip; surface; defect recognition; recognition ... See more keywords
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A Review on Recent Advances in Vision-based Defect Recognition towards Industrial Intelligence

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recommendations! Published in 2021 at "Journal of Manufacturing Systems"

DOI: 10.1016/j.jmsy.2021.05.008

Abstract: Abstract In modern manufacturing, vision-based defect recognition is an essential technology to guarantee product quality, and it plays an important role in industrial intelligence. With the developments of industrial big data, defect images can be… read more here.

Keywords: based defect; review; defect recognition; vision based ... See more keywords

Study of partial discharges measurement cycles effect on defect recognition for underground cable joints

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recommendations! Published in 2024 at "Measurement Science and Technology"

DOI: 10.1088/1361-6501/ad366c

Abstract: This study investigates the influence of various partial discharge (PD) measurement durations on defect recognition in high voltage power cable joints, aiming to address a crucial challenge in the field of insulation assessment. The main… read more here.

Keywords: cable joints; recognition; defect recognition; measurement cycles ... See more keywords

A patch-interactive enhancement network for semiconductor wafer map mixed defect recognition with a two-stage training strategy

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recommendations! Published in 2025 at "Measurement Science and Technology"

DOI: 10.1088/1361-6501/adbc0d

Abstract: To improve the product quality and process reliability in the semiconductor manufacturing, it is of great significance to detect the defect of the wafer map and recognize the defect pattern. With the increase in the… read more here.

Keywords: patch interactive; interactive enhancement; recognition; wafer map ... See more keywords

Insulator Defect Recognition Based on Global Detection and Local Segmentation

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recommendations! Published in 2020 at "IEEE Access"

DOI: 10.1109/access.2020.2982288

Abstract: Locating the tiny insulator defect object with complex backgrounds in high-resolution aerial images is a challenging task. In this paper, we propose a novel method which cascades detection and segmentation networks to identify the defect… read more here.

Keywords: defect recognition; segmentation; network; detection ... See more keywords

MSPL: Multimodal Statistical Prompt Learning for New Energy Equipment Defect Recognition

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recommendations! Published in 2025 at "IEEE Internet of Things Journal"

DOI: 10.1109/jiot.2025.3534178

Abstract: Monitoring renewable energy devices is crucial for the timely detection of faults and the improvement of system stability, making it a key component of the Internet of Things (IoT) ecosystem. However, existing intelligent algorithms and… read more here.

Keywords: energy equipment; defect recognition; energy; equipment defect ... See more keywords

Few-shot Defect Recognition for New Energy Equipment via Multi-modal Harmony

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recommendations! Published in 2025 at "IEEE Internet of Things Journal"

DOI: 10.1109/jiot.2025.3619526

Abstract: Internet of Things (IoT) technologies have been applied to fault detection in new energy equipment, which is crucial for ensuring the stable operation of energy systems. However, existing approaches typically rely on large amounts of… read more here.

Keywords: shot; recognition; energy equipment; defect recognition ... See more keywords

Hybrid Conditional Kernel SVM for Wire Rope Defect Recognition

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recommendations! Published in 2024 at "IEEE Transactions on Industrial Informatics"

DOI: 10.1109/tii.2023.3344135

Abstract: Support vector machine (SVM) has been applied in data classification and defect recognition in various scenes, the common kernels are not always suitable to satisfy the requirement of high accuracy and efficiency inspection. A new… read more here.

Keywords: wire rope; wire; rope defect; defect recognition ... See more keywords

An Explainable Laser Welding Defect Recognition Method Based on Multi-Scale Class Activation Mapping

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recommendations! Published in 2022 at "IEEE Transactions on Instrumentation and Measurement"

DOI: 10.1109/tim.2022.3148739

Abstract: Vision-based online defect recognition can provide insights for laser welding quality control systems. Although the visual signal contains richer quality information than the one-dimensional signal, the quality features contained in the visual signal are more… read more here.

Keywords: multi scale; welding defect; defect recognition; method ... See more keywords

Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition

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recommendations! Published in 2024 at "IEEE Transactions on Instrumentation and Measurement"

DOI: 10.1109/tim.2024.3374295

Abstract: The critical information regarding the semiconductor manufacturing can be provided based on the wafer map defect patterns. Automatic wafer map defect identification with machine learning methods has recently received increasing attention. The wafer map defect… read more here.

Keywords: map defect; extreme learning; wafer map; defect recognition ... See more keywords

Block-based automatic road defect recognition approach

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recommendations! Published in 2019 at "Journal of Electronic Imaging"

DOI: 10.1117/1.jei.28.5.053023

Abstract: Abstract. Efficient maintenance of road networks is an important factor for the smooth flow of traffic and is highly dependent on the timely assessment of road conditions. Road defects such as cracks and potholes cause… read more here.

Keywords: road defect; road; defect recognition; approach ... See more keywords