Impacts of silicon carbide defects on electrical characteristics of SiC devices
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DOI: 10.1063/5.0239362
Abstract: With more than thirty years of research and development until commercialization, performance, reliability, and robustness of silicon carbide (SiC) based devices have been improved significantly due to drastic reduction in crystal defects from the well-controlled… read more here.
Keywords: impacts silicon; silicon carbide; carbide defects; defects electrical ... See more keywords