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Published in 2017 at "ACS Omega"
DOI: 10.1021/acsomega.7b00734
Abstract: We present a detailed atomic-level study of defects in bilayer MoS2 using aberration-corrected transmission electron microscopy at an 80 kV accelerating voltage. Sulfur vacancies are found in both the top and bottom layers in 2H-…
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Keywords:
microscopy;
atomic structure;
dynamics defects;
defects mos2 ... See more keywords