Concentration of defects responsible for persistent photoconductivity in Cu(In,Ga)Se2: Dependence on material composition
Sign Up to like & getrecommendations! Published in 2019 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2018.11.038
Abstract: Abstract Persistent photoconductivity (PPC) in thin Cu(In,Ga)Se2 films is discussed within a model of relaxing defects acting as donors or acceptors depending on their configurational and charge state. The aim of this work is to… read more here.
Keywords: persistent photoconductivity; defects responsible; concentration defects; se2 ... See more keywords
Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs.
Sign Up to like & getrecommendations! Published in 2024 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.4c10888
Abstract: In this work, a self-consistent method is used to identify and describe defects plaguing 300 mm integrated 2D field-effect transistors. This method requires measurements of the transfer characteristic hysteresis combined with physics-based modeling of charge… read more here.
Keywords: defects responsible; experimental modeling; modeling framework; framework identifying ... See more keywords