Nanoimaging of Orientational Defects in Semiconducting Organic Films
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DOI: 10.1021/acs.jpcc.1c00059
Abstract: The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today’s electronics. By analogy, defect analysis plays a critical role in ... read more here.
Keywords: chemistry; nanoimaging orientational; orientational defects; defects semiconducting ... See more keywords