Tunneling current in w-GaN/AlN(0001) structures with deep-level defects
Sign Up to like & getrecommendations! Published in 2018 at "Superlattices and Microstructures"
DOI: 10.1016/j.spmi.2018.06.034
Abstract: Abstract The influence of the interface deep-level defects on the tunneling current of a double-barrier w-AlN/GaN (0001) structure is studied. It is shown that the peculiarities of the current essentially depend on the positions of… read more here.
Keywords: deep level; level; defects tunneling; aln ... See more keywords