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Published in 2017 at "Scientific Reports"
DOI: 10.1038/s41598-017-13191-9
Abstract: Deep-level defects in n-type GaAs1−xBix having 0 ≤ x ≤ 0.023 grown on GaAs by molecular beam epitaxy at substrate temperature of 378 °C have been injvestigated by deep level transient spectroscopy. The optical properties of the layers have been…
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Keywords:
defects type;
deep level;
level;
gaasbi ... See more keywords