Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy.
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DOI: 10.1016/j.ultramic.2018.09.018
Abstract: Abstract We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The… read more here.
Keywords: deflection cantilever; microscopy; static deflection; force ... See more keywords