Degradation and failure mechanism of AlGaN-based UVC-LEDs
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DOI: 10.1016/j.sse.2019.01.004
Abstract: Abstract The degradation behaviors of flip-chip 260 nm ultraviolet light emitting diodes (UVC-LEDs) were studied using in-situ accelerated system and different analytical technologies. The optical power of LEDs stressed at a constant DC current of 20 mA… read more here.
Keywords: degradation failure; algan based; uvc leds;