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Published in 2023 at "IEEE Transactions on Industrial Informatics"
DOI: 10.1109/tii.2022.3224960
Abstract: In order to achieve fault diagnosis and prognosis, one needs a sufficient and valid life-cycle data. However, this requirement is difficult for current high-reliable manufacturing system. Good thing is that the technique of accelerated degradation…
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Keywords:
unreliable signals;
accelerated degradation;
life;
model ... See more keywords