Thickness dependence of electronic structure and optical properties of a correlated van der Waals antiferromagnetic NiPS3 thin film
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DOI: 10.1103/physrevb.102.075124
Abstract: We study the thickness dependence of the electronic, magnetic, and optical properties of a NiPS$_3$ thin film, an antiferromagnetic charge-transfer insulator. Utilizing state-of-the-art advanced density functionals, we find the antiferromagnetic Zig-Zag order, the band gap,… read more here.
Keywords: dependence electronic; thin film; thickness; optical properties ... See more keywords