FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors
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DOI: 10.1109/tc.2021.3104736
Abstract: Ferroelectric FET (FeFET) is a highly promising emerging non-volatile memory (NVM) technology, especially for binarized neural network (BNN) inference on the low-power edge. The reliability of such devices, however, inherently depends on temperature. Hence, changes… read more here.
Keywords: temperature dependent; bit; dependent bit; bit error ... See more keywords