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Published in 2018 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2017.2774960
Abstract: We present a new model for simulation of single-event effects in fully depleted silicon on insulator (FD-SOI) technology. The model is based on direct resolution of the drift-diffusion equations on a 1-D grid aligned with…
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Keywords:
resolution;
accurate resolution;
dependent circuit;
circuit coupled ... See more keywords