Optical and microstructural characterization of nanocrystalline Cu doped ZnO diluted magnetic semiconductor thin film for optoelectronic applications
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DOI: 10.1016/j.optmat.2021.111312
Abstract: Abstract A series of Zn1-xCuxO nanocrystalline films were deposited on a silica substrate using e-beam evaporation technology. The physical properties of the deposited film were closely examined using x-ray diffraction (XRD), energy dispersive X-ray spectroscopy… read more here.
Keywords: nanocrystalline; deposited film; energy; doped zno ... See more keywords