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Published in 2021 at "MRS Communications"
DOI: 10.1557/s43579-021-00067-3
Abstract: This study investigated a normally-off p-GaN/AlGaN/GaN high electron mobility transistor with the extended p-GaN. The optimized recess depth in the AlGaN barrier under the extended region of p-GaN provides improved device characteristics. The influences of…
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Keywords:
voltage;
depth algan;
algan barrier;
barrier ... See more keywords