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Published in 2018 at "International Journal of Mass Spectrometry"
DOI: 10.1016/j.ijms.2018.04.001
Abstract: Abstract Elemental composition analysis in alloy samples using secondary ion mass spectrometry (SIMS) suffers from matrix effects which hamper the analytical results. These matrix effects arise due to numerous factors like change in surface work…
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Keywords:
quantitative depth;
analysis;
depth distribution;
distribution ... See more keywords
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Published in 2020 at "Surface and Coatings Technology"
DOI: 10.1016/j.surfcoat.2020.125494
Abstract: Abstract The influence of noble gases ion implantation on the depth distribution of elements in the TiO2/SiO2 bilayers on the Si substrates has been investigated using the Rutherford Backscattering Spectrometry (RBS). The structures were implanted…
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Keywords:
tio2 sio2;
irradiation;
depth distribution;
ion ... See more keywords
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Published in 2017 at "AIP Advances"
DOI: 10.1063/1.4983384
Abstract: Understanding tritium retention and permeation in plasma-facing components is critical for fusion safety and fuel cycle control. Glow discharge optical emission spectroscopy (GD-OES) is shown to be an effective tool to reveal the depth profile…
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Keywords:
depth;
plasma;
depth profile;
deuterium ... See more keywords