Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low‐fluence, shallow implants in diamond‐like carbon
Sign Up to like & getrecommendations! Published in 2022 at "Rapid Communications in Mass Spectrometry"
DOI: 10.1002/rcm.9454
Abstract: Rationale Back‐side thinning of wafers is used to eliminate issues with transient sputtering when analyzing near‐surface element distributions. Precise and accurate calibrated implants are created by including a standard reference material during the implantation. Combining… read more here.
Keywords: low fluence; fluence shallow; depth profiling; side ... See more keywords
Analytic function to describe interfaces and resolution consistency in sputter depth profiling
Sign Up to like & getrecommendations! Published in 2018 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6347
Abstract: A simple analytical function is derived to describe the interface shapes measured in sputter depth profiling using XPS or SIMS. This function involves the convolution of a central Gaussian function, often taken to describe the… read more here.
Keywords: resolution; depth profiling; describe; function ... See more keywords
Status monitoring of ion sputter relevant parameters of an XPS depth profiling instrument
Sign Up to like & getrecommendations! Published in 2020 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6765
Abstract: An X‐ray photoelectron spectroscopy (XPS) instrument is utilized for sputter depth profiling of thin films. Relevant instrumental parameters are the ion gun sputter rate, the contamination level of the sputter ion gun, and the purity… read more here.
Keywords: instrument; sputter; ion gun; depth profiling ... See more keywords
Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells
Sign Up to like & getrecommendations! Published in 2025 at "Surface and Interface Analysis"
DOI: 10.1002/sia.7374
Abstract: Mixed organic–inorganic halide perovskites are finding strong interest as thin film solar cell materials. XPS depth profiling of a spin‐coated (FAPbI3)0.95(MAPbBr3)0.05 perovskite thin‐film solar cell, has been performed. Profiles have been recorded using traditional monatomic… read more here.
Keywords: film solar; femtosecond laser; depth profiling; thin film ... See more keywords
Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.12.223
Abstract: Abstract The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as… read more here.
Keywords: depth profiling; ion; ion batteries; sputter depth ... See more keywords
Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.03.163
Abstract: Abstract Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies… read more here.
Keywords: depth profiling; uhv conditions; metal surfaces; spectroscopy ... See more keywords
Aging and depth profiling of inhomogeneities and interactions of CO molecules on sputtered Pt film using ATR IR spectroscopy with lineshape analysis
Sign Up to like & getrecommendations! Published in 2020 at "Chemical Physics Letters"
DOI: 10.1016/j.cplett.2019.136968
Abstract: Abstract Inhomogeneities in the IR site energies of carbon monoxide (CO) and its coupling to a metal continuum and subsequent interactions with metal were observed with ATR depth profiling using IR lineshape analysis with the… read more here.
Keywords: lineshape analysis; depth profiling; spectroscopy; molecules sputtered ... See more keywords
Effect of argon sputtering on XPS depth-profiling results of Si/Nb/Si
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Electron Spectroscopy and Related Phenomena"
DOI: 10.1016/j.elspec.2017.09.009
Abstract: Ultrathin Si/Nb/Si trilayer is an excellent example of a system for which dimensionality effects, together with other factors like type of a substrate material and growth method, influence strongly its superconducting properties. This study offers… read more here.
Keywords: effect argon; depth; sputtering xps; depth profiling ... See more keywords
Improved tritium retention modeling with reaction-diffusion code TMAP and bulk depth profiling capability
Sign Up to like & getrecommendations! Published in 2019 at "Nuclear Materials and Energy"
DOI: 10.1016/j.nme.2019.03.008
Abstract: Abstract ITER-grade tungsten (W) specimens were exposed to similar deuterium (D) plasma condition (ion flux density of 6.0 × 1021 D m − 2s−1, D ion fluence of 5.0 × 1025 D m − 2) at the surface temperature of 623 K. Thermal desorption… read more here.
Keywords: reaction diffusion; spectroscopy; depth profiling; depth ... See more keywords
In-Depth Profiling of O-Glycan Isomers in Human Cells Using C18 Nanoliquid Chromatography–Mass Spectrometry and Glycogenomics
Sign Up to like & getrecommendations! Published in 2022 at "Analytical Chemistry"
DOI: 10.1021/acs.analchem.1c05068
Abstract: O-Glycosylation is an omnipresent modification of the human proteome affecting many cellular functions, including protein cleavage, protein folding, and cellular signaling, interactions, and trafficking. The functions are governed by differentially regulated O-glycan types and terminal… read more here.
Keywords: mass spectrometry; nanoliquid chromatography; using c18; depth profiling ... See more keywords
Dual Beam Depth Profiling and Imaging with Argon and Bismuth Clusters of Prenylated Stilbenes on Glandular Trichomes of Macaranga vedeliana.
Sign Up to like & getrecommendations! Published in 2017 at "Analytical chemistry"
DOI: 10.1021/acs.analchem.7b02020
Abstract: Using a time-of-flight secondary ion mass spectrometer equipped with an argon cluster ion for sputtering and a bismuth liquid metal ion source for analysis, both surfaces of leaves and fruits of Macaranga vedeliana, an endemic… read more here.
Keywords: prenylated stilbenes; beam depth; depth profiling; macaranga vedeliana ... See more keywords