ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment
Sign Up to like & getrecommendations! Published in 2019 at "Journal of The American Society for Mass Spectrometry"
DOI: 10.1007/s13361-019-02224-4
Abstract: AbstractThe advent of cluster ion beams has paved the way to the routine 3D analysis of organic heterojunctions. Alternatively, organic thin layers have also been successfully depth profiled with a low-energy cesium ion beam (Cs+),… read more here.
Keywords: resolution; analysis; depth resolution; low energy ... See more keywords
Depth resolution and preferential sputtering in depth profiling of sharp interfaces
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.03.110
Abstract: Abstract The influence of preferential sputtering on depth resolution of sputter depth profiles is studied for different sputtering rates of the two components at an A/B interface. Surface concentration and intensity depth profiles on both… read more here.
Keywords: depth; sputtering depth; depth resolution; preferential sputtering ... See more keywords
Inorganic material profiling using Ar n + cluster: Can we achieve high quality profiles?
Sign Up to like & getrecommendations! Published in 2018 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2018.02.159
Abstract: Abstract Retrieving molecular information by sputtering of organic systems has been concretized in the last years due to the introduction of sputtering by large gas clusters which drastically eliminated the compound degradation during the analysis… read more here.
Keywords: inorganic material; material profiling; profiling using; depth resolution ... See more keywords
Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
Sign Up to like & getrecommendations! Published in 2020 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927620013860
Abstract: Owing to the development of aberration correctors in electron microscopy, lateral resolution (X-Y directions) has been improved down to ~40 pm in scanning transmission electron microscopy (STEM) [1]. Meanwhile the resolution in depth (Z) direction… read more here.
Keywords: resolution; microscopy; resolution phase; depth resolution ... See more keywords
Super resolution in depth for microwave imaging
Sign Up to like & getrecommendations! Published in 2019 at "Applied Physics Letters"
DOI: 10.1063/1.5098302
Abstract: Microwave imaging has been investigated in various areas involving nondestructive testing, biomedical imaging, and radar ranging imaging. With a lower frequency than THz and visible light, microwaves penetrate deep in dielectric materials, which enables detection… read more here.
Keywords: resolution; depth; super resolution; microwave imaging ... See more keywords
Ångstrom-Depth Resolution with Chemical Specificity at the Liquid-Vapor Interface.
Sign Up to like & getrecommendations! Published in 2022 at "Physical review letters"
DOI: 10.1103/physrevlett.130.156901
Abstract: The determination of depth profiles across interfaces is of primary importance in many scientific and technological areas. Photoemission spectroscopy is in principle well suited for this purpose, yet a quantitative implementation for investigations of liquid-vapor… read more here.
Keywords: resolution chemical; ngstrom depth; interface; liquid vapor ... See more keywords
A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
Sign Up to like & getrecommendations! Published in 2018 at "Technical Physics Letters"
DOI: 10.1134/s1063785018040181
Abstract: New data concerning the influence of a probing beam of bismuth ions on the depth resolution in elemental depth profiling by secondary ion mass spectrometry (SIMS) have been obtained on a TOF.SIMS-5 system using the… read more here.
Keywords: influence probing; depth resolution; ion; beam ... See more keywords
Improved depth resolution and depth-of-field in temporal integral imaging systems through non-uniform and curved time-lens array.
Sign Up to like & getrecommendations! Published in 2020 at "Optics express"
DOI: 10.1364/oe.382439
Abstract: Observing and studying the evolution of rare non-repetitive natural phenomena such as optical rogue waves or dynamic chemical processes in living cells is a crucial necessity for developing science and technologies relating to them. One… read more here.
Keywords: depth; imaging systems; depth field; time ... See more keywords
The Enhancement of 3D Scans Depth Resolution Obtained by Confocal Scanning of Porous Materials
Sign Up to like & getrecommendations! Published in 2017 at "Measurement Science Review"
DOI: 10.1515/msr-2017-0034
Abstract: Abstract The 3D reconstruction of simple structured materials using a confocal microscope is widely used in many different areas including civil engineering. Nonetheless, scans of porous materials such as concrete or cement paste are highly… read more here.
Keywords: resolution; enhancement scans; scans depth; depth resolution ... See more keywords