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Published in 2017 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2017.04.001
Abstract: The simulation of (scanning) transmission electron microscopy images and diffraction patterns is most often performed using the forward-scattering approximation where the second-order derivative term in z is assumed to be small with respect to the…
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Keywords:
order;
derivative term;
second order;
diffraction patterns ... See more keywords