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Published in 2018 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2018.04.029
Abstract: Abstract In this study, the role of Al substitution levels (x = 0.0–0.05) on the structure, surface morphology, optical constants, dielectric, electrical and magnetic properties of chemically derived Zn0.90-xMn0.05Fe0.05AlxO (ZMFO:Alx) thin films were systematically investigated. The results…
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Keywords:
thin films;
size;
substitution;
chemically derived ... See more keywords