Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy
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DOI: 10.1109/tmtt.2016.2642940
Abstract: A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a… read more here.
Keywords: description inhomogeneous; microscopy; samples scanning; scanning microwave ... See more keywords