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Published in 2020 at "Journal of Physical Chemistry C"
DOI: 10.1021/acs.jpcc.0c05833
Abstract: Herein, we have successfully demonstrated the microstructural evidence of the inhomogeneous interfaces in multilayered capacitors and explained the role of interface activation in the dielectric pe...
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Keywords:
designing defect;
defect free;
probing interface;
activation designing ... See more keywords