Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix
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DOI: 10.1093/micmic/ozad018
Abstract: We present a gradient-descent-based approach to determining the projected electrostatic potential from four-dimensional scanning transmission electron microscopy measurements of a periodic, crystalline material even when dynamical scattering occurs. The method solves for the scattering matrix… read more here.
Keywords: structure; four dimensional; microscopy; determining projected ... See more keywords