Articles with "deterministic test" as a keyword



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A New Static Compaction of Deterministic Test Sets

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Published in 2023 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2023.3240246

Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test application time,… read more here.

Keywords: compaction; deterministic test; test pattern; test set ... See more keywords