Efficient defect identification of soft failures induced by device local mismatch for nano-scale SRAM yield improvement
Sign Up to like & getrecommendations! Published in 2017 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2016.12.006
Abstract: Abstract As the device size continues shrinking to nano-scale region, tiny defects induced device local mismatch in SRAM array becomes a major yield limiter. It is often quite time consuming and challenging to identify such… read more here.
Keywords: methodology; local mismatch; induced device; device local ... See more keywords
A device for the local measurement of water evaporation rate
Sign Up to like & getrecommendations! Published in 2020 at "Measurement Science and Technology"
DOI: 10.1088/1361-6501/abb438
Abstract: Evaporation plays a central but largely invisible role in the moisture dynamics of buildings and urban microenvironments. Local evaporation rates control water flux and material damage, and are altered by climate change. While potential evaporation… read more here.
Keywords: measurement water; water; evaporation; device local ... See more keywords